ECE 4365 - Parametric and Functional Device Testing
3 Semester Credit Hours Prerequisite: 2.5 TTU GPA; C or better in ECE 3331 and ECE 3308 or MATH 3342 or IE 2341. For majors only or departmental consent. Fundamentals of semiconductor device chip and wafer testing. Parametric and functional tests, test philosophy, C programming for testing, and commercial wafer level testers.
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