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    Texas Tech University
   
 
  Jan 23, 2018
 
 
    
2017-2018 Undergraduate and Graduate Catalog
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CHE 5348 - Materials Applications for Scanning Probe Microscopy

3 Semester Credit Hours
The science and technology of scanning probe techniques, including scanning tunneling microscopy, near field scanning optical microscopy, and atomic force microscopy, applied to materials characterication.



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