Oct 20, 2018  
2017-2018 Undergraduate and Graduate Catalog 
    
2017-2018 Undergraduate and Graduate Catalog [ARCHIVED CATALOG]

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ECE 4365 - Parametric and Functional Device Testing

3 Semester Credit Hours
Prerequisite: C or better in ECE 3332  and MATH 3342  or IE 3341 ; GPA 2.5; majors only or departmental consent. Fundamentals of semiconductor device chip and wafer testing. Parametric and functional tests, test philosophy, C programming for testing, and commercial wafer level testers.



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