The page uses Browser Access Keys to help with keyboard navigation. Click to learn moreSkip to Navigation

Different browsers use different keystrokes to activate accesskey shortcuts. Please reference the following list to use access keys on your system.

Alt and the accesskey, for Internet Explorer on Windows
Shift and Alt and the accesskey, for Firefox on Windows
Shift and Esc and the accesskey, for Windows or Mac
Ctrl and the accesskey, for the following browsers on a Mac: Internet Explorer 5.2, Safari 1.2, Firefox, Mozilla, Netscape 6+.

We use the following access keys on our gateway

n Skip to Navigation
k Accesskeys description
h Help
    Texas Tech University
  Jan 24, 2018
2017-2018 Undergraduate and Graduate Catalog
[Add to Portfolio]

ECE 4365 - Parametric and Functional Device Testing

3 Semester Credit Hours
Prerequisite: C or better in ECE 3332  and MATH 3342  or IE 3341 ; GPA 2.5; majors only or departmental consent. Fundamentals of semiconductor device chip and wafer testing. Parametric and functional tests, test philosophy, C programming for testing, and commercial wafer level testers.

[Add to Portfolio]