Feb 02, 2025  
2022-2023 Undergraduate and Graduate Catalog 
    
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2022-2023 Undergraduate and Graduate Catalog [ARCHIVED CATALOG]

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ECE 4365 - Parametric and Functional Device Testing

3 Semester Credit Hours
Prerequisite: 2.5 TTU GPA; C or better in ECE 3331  and ECE 3308  or MATH 3342  or IE 2341 . For majors only or departmental consent. Fundamentals of semiconductor device chip and wafer testing. Parametric and functional tests, test philosophy, C programming for testing, and commercial wafer level testers.


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