May 27, 2022  
2016-2017 Undergraduate and Graduate Catalog 
    
2016-2017 Undergraduate and Graduate Catalog [ARCHIVED CATALOG]

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ECE 5365 - Parametric and Functional Device Testing

3 Semester Credit Hours
Fundamentals of semiconductor device chip and wafer testing. Parametric and functional tests, test philosophy, C programming for testing, and commercial wafer level testers.



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